Computational Intelligence for Decision Support in Cyber-Physical Systems

Dr. Khan received his PhD in Automatic Control from University of Grenoble, France in 2010. Since then, he is actively collaborating in research as well as teaching courses at National University of Science and Technology (NUST), Pakistan. His research interests include Networked Control Systems, Computational Intelligence and Soft Computing, Cyber Physical Systems, Fault detection and Fault tolerant control etc. He has published many research papers in IEEE Conferences and international journals. He is a member of IEEE and SEE.






Dr. Ali is a visiting scholar in the Data Mining Laboratory, Kansai University, Japan and the Director of i-LaB Australia. He received his PhD in Information Technology from Clayton School of Information Technology, Monash University in 2005. His research interests include Computational Intelligence, Data Mining, Smart Grid, Cloud Computing and Biomedical Engineering. He has published more than 110 research papers in international journals and conferences. He is an IEEE Senior Member.

Dr. Riaz is currently working as a full time postdoctoral researcher at the Institute for Intelligent Analysis and Information Systems (IAIS) Fraunhofer Gesellschaft, Germany. He completed his PhD from Technical University of Munich (TUM), Germany in 2011 in the area of computer vision and image processing. He was awarded the German Academic Exchange Service (DAAD) and Higher Education Commission of Pakistan (HEC) fellowship in 2007 and European Research Consortium for Informatics and Mathematics (ERCIM) fellowship in 2011. Dr. Riaz is also serving as project coordinator for Context Aware Perception for Assistive Environments under DAAD program for German-Pakistani Universities collaboration. In 2009-10, he worked as a visiting researcher in computer vision lab at University of Central Florida (UCF). His research interests include image processing, computer vision, pattern recognition, assistive robotics, CPS etc. He is a member of IEEE.