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  • Produktbild: Advances in X-Ray Analysis
  • Produktbild: Advances in X-Ray Analysis

Advances in X-Ray Analysis Volume 25

49,99 €

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Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

24.07.2012

Abbildungen

XVIII, 398 p. 104 illus.

Herausgeber

John C. Russ

Verlag

Springer Us

Seitenzahl

398

Maße (L/B/H)

24,4/17/2,3 cm

Gewicht

721 g

Auflage

Softcover reprint of the original 1st ed. 1982

Sprache

Englisch

ISBN

978-1-4613-9995-7

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

24.07.2012

Abbildungen

XVIII, 398 p. 104 illus.

Herausgeber

John C. Russ

Verlag

Springer Us

Seitenzahl

398

Maße (L/B/H)

24,4/17/2,3 cm

Gewicht

721 g

Auflage

Softcover reprint of the original 1st ed. 1982

Sprache

Englisch

ISBN

978-1-4613-9995-7

Herstelleradresse

Springer-Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

Email: GPSR Kontakt

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  • Produktbild: Advances in X-Ray Analysis
  • Produktbild: Advances in X-Ray Analysis
  • I. XRF Detectors and XRF Instrumentation.- Solid-State Room-Temperature Energy Dispersive X-Ray Detectors.- Preliminary Study of the Behavior of HPGe Detectors with Ion Implanted Contacts in the Ultralow-Energy X-Ray Region.- Performance of Room-Temperature X-Ray Detectors Made from Mercuric Iodide (HgI2) Platelets.- The Gas Proportional Scintillation Counter as a Room Temperature Detector for Energy Dispersive X-Ray Fluorescence Analysis.- Performance Characteristics of a High Resolution Si(Li) Detector Using a Time Variant Amplifier and a Pulsed Source of X-Rays.- X-Ray Tubes for Energy Dispersive XRF Spectrometry.- Toroidal Monochromators in Hybrid XRF System Improve Effectiveness of EDXRF Ten Fold.- II. XRF Methods: Practical, Mathematical.- The Use of Polarized X-Rays for Improved Detection Limits in Energy Dispersive X-Ray Spectrometry.- X-Ray Fluorescence of Intermediate-to High-Atotaic-Number Elements Using Polarized X Rays.- Examples of Analysis from an Integrated X-Ray Fluorescence Analysis System Using NRLXRF.- A Modular ADC/Microcomputer System for Energy Dispersive X-Ray Spectroscopy.- Volatilization,of Sulfur in Fusion Techniques for Preparation of Discs for X-Ray Fluorescence Analysis.- Techniques for the Preparation of Lithium Tetraborate Fused Single and Multielement Standards.- III. XRF Applications: Mineral and Geological.- The Use of EDXRF for Liquids in a Uranium-Vanadium Solvent Extraction Process.- A Resin-Loaded Paper X-Ray Fluorescence Method for Determining Uranium in Phosphate Materials.- The X-Ray Analysis of Uranium Ores for Iron Sulfide Minerals.- A Statistical Comparison of Data Obtained from Pressed Disk and Fused Bead Preparation Techniques for Geological Samples.- Trace and Minor Element Analysis of Obsidian from the San Francisco Volcanic Field Using X-Ray Fluorescence.- Quantitative Determination of Ga, Zn, Cu, Ni, Mn, and Cr by X-Ray Fluorescence in Laterites and Bauxites Using Two Evaluation Methods.- A Combined Dilution and Line-Overlan Coefficient Solution for the Determination of Rare Earths in Monazite Concentrates.- Feasibility Study for On-Stream X-Ray Analysis of Barite.- IV. XRF Applications. Metals, Catalysts, Oils.- “Standard-Background” Method of X-Ray Spectral Analysis for Quality Control of Noble Metals in Alumina-Based Automobile Exhaust Catalysts.- Some Elemental Determinations of Catalytic Materials Using a Thin-Film Internal Standard Technique by Radioisotope Excited X-Ray Fluorescence.- Energy Dispersive X-Ray Measurements for Cesium and Silver in Zeolite Ion-Exchange Columns.- Direct Analysis of Plutonium Metal for Gallium, Iron and Nickel by Energy Dispersive X-Ray Spectrometry.- The Analysis of Copner Alloys by Chem-X, Low Power F?DX Multichannel Spectrometer.- Energy Dispersive XRF Analysis of Lubricating Oil Additives with Secondary Target Excitation and the EXACT Fundamental Parameters Program.- The Analysis of Oil Additives Using Fundamental Influence Coefficients.- V. XRF Environmental Applications.- The Measurement of Low Concentrations of Organic and Inorganic Gaseous Contaminants in Occupational Environments by X-Ray Spectrometry (XRS).- The Application of X-Ray Fluorescence and Diffraction to the Characterization of Environmental Assessment Samples.- Accurate PIXE Analysis of Thin Samples, Aerosol Loaded Filters and Surface Layers of Thick Samples.- Energy Dispersive Analysis of Actinides, Lanthanides, and Other Elements in Soil and Sediment Samples.- X-Ray Fluorescence Analysis of Welding Fume Particles.- VI. XRD Search/Match Procedures and Automation.- A NewComputer Algorithm for Qualitative X-Ray Powder Diffraction Analysis.- A Versatile Minicomputer X-Ray Search/Match System.- Automatically Correcting for Specimen Displacement Error During XRD Search/Match Identification.- X-Ray Diffraction Phase Analysis Using Microcomputers.- A Second Generation Automated Powder Diffractometer Control System.- Application of the Modified Snyder’s Program for the Data Processing of an Automated X-Ray Powder Diffractometer.- INDEX, A Program to Reconcile Powder Diffractograms.- IDENT — A Versatile Microfile-Based System for Fast Interactive XRPD Phase Analysis.- VII. XRD Methods and Instrumentation.- Complete Quantitative Analysis Using Both X-Ray Fluorescence and X-Ray Diffraction.- Calibration of the Diffractometer at Low Values of Two Theta.- Schreiner Sample Preparation and Methodology for X-Ray Quantitative Analysis of Thin Aerosol Layers Deposited on Glass Fiber and Membrane Filters.- Differential X-Ray Diffraction by Wavelength Variation: A Preliminary Investigation.- X-Ray Diffraction Quantitative Analysis Using Intensity Ratios and External Standards.- A Guinier Diffractometer with a Scanning Position Sensitive Detector.- Observation of an X-Ray Beam of 10 Microradian Divergence Without Using Any Collimator.- VIII. XRD Applications.- X-Ray Residual Stress Mapping in Industrial Materials by Energy Dispersive Diffractometry.- Stress Measurement and Precision Diffraction Angles on Large Grained Specimens.- Determination of Residual Stresses in Austenite and Martensite in Case-Hardened Steels by the Sin2? Method.- X-Ray Characteristics and Applications of Layered Synthetic Microstructures.- The Use of Energy Dispersive Diffractometry to Measgre the Thickness of Metal and Glass Thin Films.- Application of Automated X-RayDiffraction to Alteration Mineral Zoning Studies.- The Application of X-Ray Diffraction for Glass Batch Homogeneity Determination.- X-Ray Diffraction and Fluorescence in the Analysis of Pharmaceutical Excipients.- Corrections to Volume 24..- Author Index.