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  • Produktbild: Advances in X-Ray Analysis
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Advances in X-Ray Analysis Volume 4 Proceedings of the Ninth Annual Conference on Application of X-Ray Analysis Held August 10–12 1960

Aus der Reihe Advances in X-Ray Analysis
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Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

03.05.2013

Abbildungen

VIII, 568 p. 144 illus.

Verlag

Springer Us

Seitenzahl

568

Maße (L/B/H)

22,9/15,2/3,2 cm

Gewicht

829 g

Auflage

Softcover reprint of the original 1st ed. 1961

Sprache

Englisch

ISBN

978-1-4684-8636-0

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

03.05.2013

Abbildungen

VIII, 568 p. 144 illus.

Verlag

Springer Us

Seitenzahl

568

Maße (L/B/H)

22,9/15,2/3,2 cm

Gewicht

829 g

Auflage

Softcover reprint of the original 1st ed. 1961

Sprache

Englisch

ISBN

978-1-4684-8636-0

Herstelleradresse

Springer-Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

Email: ProductSafety@springernature.com

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  • Produktbild: Advances in X-Ray Analysis
  • Produktbild: Advances in X-Ray Analysis
  • The Use of Optical Transforms in Crystal-Structure Analysis.- X-Ray Diffraction Investigation of BeO Calcination Processes.- Crystallite Size and Particle Size Measurements on BeO Powders by X-Ray Methods.- X-Ray Diffraction Investigation of Vacuum-Deposited Metallic Films.- The Use of Computer Techniques to Plot Pole Figures.- A Precise Determination of the Atomic Position Parameter for ?-Uranium.- The Debye Temperature of Carbonyl Iron.- Use of X-Ray Spectrometer Data in Radial Distribution Analysis of the Diffraction Patterns for Amorphous Materials.- A Technique for Studying Coprecipitated Chromia-Alumina Catalysts by X-Ray Diffraction.- X-Ray Studies of Basic Lead Azides.- Determination of Relative Stability of Urea Complexes from X-Ray Powder Diffraction Data.- Electrocrystallography of Cobalt and Cobalt-Nickel Alloys.- X-Ray Studies in the Ti-O System.- A New High-Power Microfocus X-Ray Diffraction Unit.- Design and Applications of a Variable-Temperature Diffractometer Specimen Mount.- A Simple Goniostat for the Norelco Diffractometer.- Counter Adaptor and Furnace for Weissenberg Camera.- A Study of Phase Reactions in a Complex 4.5 Al — 3.5 Ti — Ni Base Alloy.- Measurement in the 10 to 100 Angstrom X-Ray Region.- The Spectra of Some Beta-Excited X-Ray Sources with the Multichannel Analyzer.- A New Commercial X-Ray Projection Microscope.- An X-Ray Absorption Technique for Measurement of Coat Weight on Paper.- X-Ray Absorption Measurement of Steam Voids in Water at High Pressures.- Industrial Applications of X-Ray Methods for Measuring Plating Thickness.- The Fundamentals of Quantitative Electron Probe Microanalysis.- Pulse Height Selection in X-Ray Fluorescence.- The Effect of Particles and Surface Irregularities on the X-Ray Fluorescent Intensity of SelectedSubstances.- Fluorescent X-Ray Spectrographic Analyses of Amphibolite Rocks and Constituent Hornblendes.- The Evaluation and Improvement of X-Ray Emission Analysis of Raw-Mix and Finished Cements.- The Effects of Operating Variables in the Application of Multielement Calibration Systems for Fluorescent X-Ray Spectrographic Analyses of Mineral Samples.- X-Ray Spectrometric Determination of Copper, Tin, and Uranium in Bronze Heat-Treating Material.- X-Ray Fluorescence Analysis of Tungsten-Molbydenum Metals and Electrolytes.- Fluorescence Analysis of Trace Amounts of Hafnium in Zirconium Using a Silicon Crystal.- An Application of X-Ray Fluorescent Spectrography to Columbium Alloy Melting Practices.- Norelco Pin-Hole Attachment.- New Instruments for X-Ray Analysis.- Novel Features Incorporated in a New Automatic X-Ray Fluorescence Spectrometer.- A High-Speed, Selective Uniform-Particle-Size Grinder for the Preparation of Analytical Samples.- Author Index.